The latest news about EUV Tech’s products, events, and announcements
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EUV Tech Introduces New Pellicle Deflection Tool
October 17, 2023
EUV Tech is excited to announce the development and availability of its new Pellicle Deflection Tool (PDT). This latest EUVT innovation has been designed for use in tracking and optimizing pellicle performance in extreme ultraviolet lithography (EUVL) applications.
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EUV Tech Ranks #30 for Best Workplaces in Manufacturing & Production
September 7, 2023
EUV Tech has been listed at #30 on Fortune’s Best Small and Medium Workplaces in Manufacturing & Production for 2023 by Fortune.com.
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EUV Tech’s Latest Innovation Earns Recognition as Recipient of an R&D 100 Award
August 22, 2023
EUV Tech is thrilled to announce that we have been named a winner of a prestigious R&D 100 Award for the EUV N&K and Phase Measurement Tool in the Analytics/Test category.
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EUV Tech Enables Semiconductor Manufacturing Using Extreme Ultraviolet Lithography
July 11, 2023
EUV Tech is known as a global leader in the production of metrology equipment to enable leading-edge semiconductor manufacturing using extreme ultraviolet lithography (EUVL). To learn more about the company Pulse 2.0 interviewed EUV Tech CEO Dr. Patrick Naulleau.
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Dr. Seong-Sue Kim Appointed to EUV Tech's Board of Directors
Martinez, CA, June 7, 2023
EUV Tech is excited to announce the appointment of Dr. Seong-Sue Kim as a new member of the company’s Board of Directors.
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ClassOne Equipment Delivers Advanced 300mm Takano Particle Detection System to EUV Tech
June 5, 2023
ClassOne Equipment announced the delivery of its advanced new Takano WM-10 particle measurement system to EUV Tech, a global leader in metrology equipment for cutting-edge EUV chip manufacturing. The announcement was made by ClassOne Equipment Vice President, David Pawlak, and EUV Tech Vice President of R&D, Matt Hettermann.
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EUV Tech Introduces New Multi-Use Actinic EUV Metrology Tool
Martinez, CA, May 11, 2023
EUV Tech, a global leader in the production of at-wavelength EUV metrology tools, is excited to announce the release of the new EUV N&K and Phase Measurement Tool, its latest innovation in extreme ultraviolet lithography (EUVL) technology.
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Diversity in Semiconductor Supply Chain
Martinez, CA, April 3, 2023
“There are a lot of great reasons for companies to prioritize a diverse supply chain,” Rupert [Perera] said in a written interview. “It’s especially crucial in STEM disciplines, where these fields still struggle with both cultural and gender diversity. This can filter down in a positive way into local communities by helping suppliers attract and retain diverse talent, investing in student internship programs, and growing demand in general for STEM jobs.”
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EUV Tech Raises Series A Funding
Martinez, CA, March 1, 2023
Capital to accelerate EUV Tech product roadmap in support of leading-edge semiconductor lithography
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Dr. Patrick Naulleau, Ph.D., is the new CEO of EUV Tech, Inc.
Martinez, CA, August 16, 2022
EUV Tech, a global leader in the development and production of metrology equipment to advance cutting-edge EUV chip manufacturing, announced today that Dr. Patrick Naulleau, Ph.D., has been named the new CEO.
Naulleau brings more than 25 years of industry experience and knowledge to EUV Tech.
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Tempo Automation Accelerates EUV Tech’s Time to Market by Streamlining Prototyping
San Francisco, February 8, 2022
Tempo’s software-driven approach to smart electronics manufacturing saves EUV Tech weeks of development time for semiconductor manufacturing tools.
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EUV Tech, Inc. Completes Development of Next Generation Mask Defect Review Tool
Martinez, CA, February 24, 2020
The EUV microscope has the potential to transform the current semiconductor manufacturing landscape.
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EUV Tech, Inc. Develops First At-Wavelength EUV Pellicle Inspection Tool
Martinez, CA, February 18, 2016
EUV Tech announces the successful development of the first at-wavelength EUV Pellicle inspection tool. This tool was used to measure the transmission uniformity and map the thermal distribution from the absorbed EUV power on a full size pellicle. The EUV Pellicle Inspection tool expands EUV Tech’s product line of world class EUV metrology equipment to support next-generation EUV lithography.
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EUV Tech, Inc. Delivers Next Generation High-Volume Manufacturing EUV Reflectometer
Martinez, CA, August 17, 2015
EUV Tech delivers a next-generation Reflectometer to evaluate the reflectivity and uniformity of EUV photomasks to a major U.S chip manufacturer. The new tool extends EUV Tech’s lead in developing metrology equipment to support next-generation EUV lithography.